Hi Team,
My Japanese customer has a question about TPS2410. The question is below:
Although the external FET is driven by TPS2410, there is a possibility that the external FET may overheat abnormally at the time of TPS2410 failure.
For example, if the VDD line is broken inside as a failure of TPS2410, is there any way to detect it?
I would like to use the UV input to detect VDD disconnection.
By connecting UV input to GND, PG output becomes LOW when VDD voltage is 5V. PG output goes HI when the VDD voltage disappears.
Is there any effect on anything other than PG output when UV input is connected to GND?
From the block diagram, it seems that there is no influence except PG signal.
BR
Tom.Liu
