Tool/software: WEBENCH® Design Tools
TPS40400 around 1% damaged failure rate was found at manufacturing process (function test station). a test fixture with TI USB i2c tools, CLK and DATA singnal pin connect to TPS40400 via test probe directly.
while the UUT is being put or remove. CLK and DATA is 3.3V at idle status. is it caused to damage the TPS40400? should i need to control the CLK DATA with switch?