TMS320F280x SEU and Device Reliability Reports

Caglar Altuntasoglu

Hi,

My name is Caglar Altuntasoglu, working at ASELSAN in Turkey as an FPGA Design Engineer. Here, I would like to make an enquiry about the DSP, TMS320F280x.

- May I learn if there are any SEU(Single Event Upset) Analysis Report about this device? If so, could you share the SEU analysis report with us?

- If possible, could you also share the Device Reliability Report with us?

Best Regards,

Caglar Altuntasoglu.

over 3 years ago

0 Han Zhang6 over 3 years ago

TI__Expert 6705 points

Hi Caglar,

Can you please share the device that you are look for the SEU information? If you really meant to ask about F280x device (such as this one https://www.ti.com/product/TMS320F2801), we do not have for these old device. We do have failure rate data in FMEDA of new devices that we support functional safety with (F2837xS/D, F2807x, F28004x, F28003x, etc.). If you are interested in one of these devices, you can contact your local TI sales office. The failure rate data is only shared under safety NDA. Thanks.

Han

0 Caglar Altuntasoglu over 3 years ago in reply to Han Zhang6

Prodigy 20 points

Hi Han,

I am sorry to hear that you don't have seu info about F280x devices. What about TMS320C6748EZWTD4? Do you have any SEU analysis report for this device?

Best Regards,

Caglar Altuntasoglu.

0 Han Zhang6 over 3 years ago in reply to Caglar Altuntasoglu

TI__Expert 6705 points

Hi Caglar,

The best data I can find for the F280x device will be from the website below, which has MTBF and FIT estimation for TI parts.

https://www.ti.com/quality/docs/estimator.tsp?OPN=TMS320F2801PZQ&CPN=&partNumber=TMS320F2801#resultstable

For C6x device, please create separate post on the C6000 forum. Thanks.

Han

0 Caglar Altuntasoglu over 3 years ago in reply to Han Zhang6

Prodigy 20 points

Hi Han,

Thank you for your prompt answer and the website that you have shared with us. Here, there is one thing that got me thinking.

Could you just tell me what kind of situations are considered as a failure here? For example, is a single event upset in a memory or a latch-up deemed as a failure according to this report? Do you people making safety analysis check the memory content regularly to catch the upsets during acceleration testing? Long story short, I just wonder how a failure is defined in the reliability report .

Best Regards,

Caglar Altuntasoglu.

0 Han Zhang6 over 3 years ago in reply to Caglar Altuntasoglu

TI__Expert 6705 points

Hi Caglar,

We have an app note to how to use this data for PoH estimates

https://www.ti.com/lit/an/sprabx4b/sprabx4b.pdf?ts=1645530629155

Also helpful e2e post

https://e2e.ti.com/support/microcontrollers/c2000-microcontrollers-group/c2000/f/c2000-microcontrollers-forum/828156/f28m36p63c2-mtbf-of-f28m36

Han

+1 Han Zhang6 over 3 years ago in reply to Caglar Altuntasoglu

TI__Expert 6705 points

Hi Caglar,

Just append to my earlier answer, after confirmation with team, failure that is captured in the FIT rate estimate only considered permanent faults, hence it doesn’t include any soft errors caused by radiation/noise immunity, etc. Thanks.

Han

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TMS320F280x SEU and Device Reliability Reports