Our Design used a Siatra AM3356 Prozessor.
For us Teststrategy we will used BoundaryScanTests. The BSDL File that we used is the Rev2.1 (SPRM607.bsd).
By Running the BoundaryScanTest on us PCB's we get multiple Errors of different PCB's. All This Errors affect signals of the RAM (Address, Data and Control).
The errors are reproducible.
The error behavior shows that the BSCAN input cell always sees a high level. On one example, a series resistor was removed from the "DDR_D2" line and the following cases were observed with our Göpel debugger:
1. Signal with external 10K pull-up on DDR_D2
2nd signal with external 10K pull-down on DDR_D2
3. Signal DDR_D2 NotConnected
In the debugger, the BSCAN output cell is displayed as "D" for drive and the BSCAN input cell as "M" for measure.
Questions:
a. Do you perhaps have an explanation as to what is wrong with this input cell ??
b. Perhaps it is also with the BSDL file?
c. Do you perhaps have contact with customers who use these processors (AM3356) and also use BoundaryScanTest?
