Other Parts Discussed in Thread: TDA4VH, TDA4VM
Issue description:
Conducting validation(TDA4VH+LPDDR4 4GB) in Samsung Korea site under mutual customer's request, test case/criteria and test conditions are given from TI(Kevin Scholz) as follows:
Test case / pass criteria: Linux memtester [2 instances; 2 loops of 1.2 GB (~ 1 hour)]
o memtester 1200M 2 > /usr/memtester_results/memtester1.txt & o memtester 1200M 2 > /usr/memtester_results/memtester2.txt & o …. <~ 1 hour> o cat /usr/memtester_results/memtester1.txt o cat /usr/memtester_results/memtester2.txt - Pass = no failures reported to the UART terminal
Test conditions:
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We tested @cold and @room temperature and both passed. But @hot temperature, we set Ta as 75'C and we checked TDA4VH's temp sensor indicating 105~110'C.
And single bit fail happened, and at Ta=85'C, the temp sensor indicated 120~125'C and DRAM rebooted. (We assume this happened because of SOC's throttling)
We have modified some parameters that we could control, but all DOEs failed as follows:
Number |
description |
Freq. |
Ta |
SoC Tj (@IDLE) |
LVDD |
NVDD |
HVDD |
Pass condition with |
DQ ODT (48ohm), SoC ODT (48ohm), DRAM PDDS (48ohm) |
4266+5%O.C |
75℃ |
105~110℃ |
Single Bit Fail |
- |
- |
DOE02 |
DQ ODT (48→80ohm) |
4266+5%O.C |
75℃ |
105~110℃ |
Booting Fail |
- |
- |
DOE03 |
DQ ODT (48→120ohm) |
4266+5%O.C |
75℃ |
105~110℃ |
Booting Fail |
- |
- |
DOE04 |
SoC ODT (48→80ohm) |
4266+5%O.C |
75℃ |
105~110℃ |
Booting Fail |
- |
- |
DOE05 |
SoC ODT (48→120ohm) |
4266+5%O.C |
75℃ |
105~110℃ |
Booting Fail |
- |
- |
DOE06 |
DRAM PDDS(48→60ohm) |
4266+5%O.C |
75℃ |
105~110℃ |
Booting Fail |
- |
- |
DOE07 |
DRAM PDDS(48→80ohm) |
4266+5%O.C |
75℃ |
105~110℃ |
Single Bit Fail |
- |
- |
Samsung DDR PN: K4FBE3D4HB-KHCL
SW SDK version: 08.06.00.12 (I hope I wrote correctly)
DDR config tool version and the table filled with the paramters of Samesung DDR: Rev. 0.10.0
DRAM IO Configuration |
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DDRSS0 Values |
DDRSS1 Values |
DDRSS2 Values |
DDRSS3 Values |
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Parameter Group |
Parameter |
Frequency Set 0 |
Frequency Set 1 |
Frequency Set 2 |
Frequency Set 0 |
Frequency Set 1 |
Frequency Set 2 |
Frequency Set 0 |
Frequency Set 1 |
Frequency Set 2 |
Frequency Set 0 |
Frequency Set 1 |
Frequency Set 2 |
Units |
Notes |
VREF Control |
DQ VREF Range |
Range 0 |
Range 0 |
Range 0 |
Range 0 |
Range 0 |
Range 0 |
Range 0 |
Range 0 |
Range 0 |
Range 0 |
Range 0 |
Range 0 |
- |
2 |
DQ VREF |
16 |
16 |
16 |
16 |
16 |
16 |
16 |
16 |
16 |
16 |
16 |
16 |
% of VDDQ |
2 |
|
CA VREF Range |
Range 0 |
Range 0 |
Range 0 |
Range 0 |
Range 0 |
Range 0 |
Range 0 |
Range 0 |
Range 0 |
Range 0 |
Range 0 |
Range 0 |
- |
2 |
|
CA VREF |
25.6 |
25.6 |
25.6 |
25.6 |
25.6 |
25.6 |
25.6 |
25.6 |
25.6 |
25.6 |
25.6 |
25.6 |
% of VDDQ |
2 |
|
Drive Strength |
Pull-Down (PDDS) |
RZQ/5 |
RZQ/5 |
RZQ/5 |
RZQ/5 |
RZQ/5 |
RZQ/5 |
RZQ/5 |
RZQ/5 |
RZQ/5 |
RZQ/5 |
RZQ/5 |
RZQ/5 |
Ohms |
2, 3 |
Pull Up Calibration |
VDDQ / 3 |
VDDQ / 3 |
VDDQ / 3 |
VDDQ / 3 |
VDDQ / 3 |
VDDQ / 3 |
VDDQ / 3 |
VDDQ / 3 |
VDDQ / 3 |
VDDQ / 3 |
VDDQ / 3 |
VDDQ / 3 |
- |
2 |
|
Termination |
CA ODT Disable |
ODT_CA Bond Pad |
ODT_CA Bond Pad |
ODT_CA Bond Pad |
ODT_CA Bond Pad |
ODT_CA Bond Pad |
ODT_CA Bond Pad |
ODT_CA Bond Pad |
ODT_CA Bond Pad |
ODT_CA Bond Pad |
ODT_CA Bond Pad |
ODT_CA Bond Pad |
ODT_CA Bond Pad |
- |
2 |
CK ODT Override |
Enable |
Enable |
Enable |
Enable |
Enable |
Enable |
Enable |
Enable |
Enable |
Enable |
Enable |
Enable |
- |
2 |
|
CS ODT Override |
Enable |
Enable |
Enable |
Enable |
Enable |
Enable |
Enable |
Enable |
Enable |
Enable |
Enable |
Enable |
- |
2 |
|
CA ODT |
RZQ/4 |
RZQ/4 |
RZQ/4 |
RZQ/4 |
RZQ/4 |
RZQ/4 |
RZQ/4 |
RZQ/4 |
RZQ/4 |
RZQ/4 |
RZQ/4 |
RZQ/4 |
Ohms |
2, 3 |
|
DQ ODT |
RZQ/5 |
RZQ/5 |
RZQ/5 |
RZQ/5 |
RZQ/5 |
RZQ/5 |
RZQ/5 |
RZQ/5 |
RZQ/5 |
RZQ/5 |
RZQ/5 |
RZQ/5 |
Ohms |
2, 3 |
|
SOC ODT |
RZQ/5 |
RZQ/5 |
RZQ/5 |
RZQ/5 |
RZQ/5 |
RZQ/5 |
RZQ/5 |
RZQ/5 |
RZQ/5 |
RZQ/5 |
RZQ/5 |
RZQ/5 |
Ohms |
1, 2, 3 |
Other: