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TMDS64GPEVM: Unknow circuit about Kelvin Sensing

Part Number: TMDS64GPEVM

Hi,

We design AM64x with a referent sch of  PROC101C(001) TMDS64GPEVM REV C VER 1.1.

There is a circuit on the page 10, named  Core & Array Core Supply Kelvin Sensing, but I do not know what it to do.

Please tell me the function of this circuit and can I delete this part.

Thanks. 

  • Hello Huang Feng,

    Thank you for the query.

    The circuit is used for internal testing. This is used for testing of noise level on the low voltage/high current power rails. This is a test function/debug function, and certainly not needed on an end product. 

    In case you do not have space constraint and interested doing measurements on the prototype, you could provide the provision.

    Be sure to follow the EVM for the component placement for getting optimal performance.

    Regards,

    Sreenivasa

  • Hello Huang Feng,

    Here are some additional inputs i received.

    It is intended that supply has a private trace from underneath the power pin BGA as well as a second private trace underneath the nearest GND pin BGA of the processor. This way we can use a high speed power rail probe to measure instantaneous supply ripple noise.

    Detailed explanation

    Sometimes, we need to characterize AC noise on an SoC’s DC power supply.  For example, we may need to look for voltage dips that might bring the supply below the minimum spec’d voltage.  In the past, it has been difficult to make this type of measurement well.  There are different schools of thought on this.  A relatively convenient method is to use a differential probe to measure across a decoupling capacitor that’s placed close to the SoC’s power balls.  However, the de-cap acts to filter the measurement, leading to an optimistic measurement.  A better approach is to probe at vias near the SoC balls, but this is also difficult since vias may not always be conveniently placed for probing.  In the EVM, Kelvin sensing circuits were included that make it easy to use a power measurement probe to measure AC noise on DC supplies.  The supply and gnd nets are routed away from the SoC using private traces, and the test points are also outside of the SoC socket

    I do not think a customer would need this in a production board, but if they have space in their prototype board it is useful to prove they are satisfying the voltage recommended operating conditions at the processor pins, which is where it matters.

    Regards,

    Sreenivasa