This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

TDA4AL-Q1: The adc data collected by the temperature rise software is abnormal

Part Number: TDA4AL-Q1
Other Parts Discussed in Thread: TDA4VM

Hi,

The temperature rise test needs to heat the TDA4S2 chip to 120℃ for about 10min. At this time, the adc data of the host computer is abnormal, and the error is more than 10% with the actual measured value, and the actual measured voltage value does not change.

The following image, by using the multimeter measurement, the voltage of ETH_0V9 is stable at "0.932V", but the voltage of ADC05_ETH_0V9 is affected by temperature. The hardware confirms that this phenomenon is not normal, and if the connection between ADC05_ETH_0V9 and SOC is disconnected, the voltage of ADC05_ETH_0V9 is very stable and will not fluctuate.

TDA4AL has this problem, but TDA4VM of other projects has no problem.

In summary, is the voltage at the actual measurement point affected by the SOC adc pins? Is the problem related to the software configuration? Or is it platform hardware dependent?

[SDK version]  8.6.0

Looking forward to your reply.

Thanks!