Hi Ti,
with our Boundary Scan test, we want to test capacitively decoupled PCIe lines!!!
The standard for this is IEEE1149.6.
According to the TDA4VV TRM, this standard is also supported by the TDA4.
In the BSDL file itself, however, there is no complete information except for the boundary scan commands EXTEST_PULSE and ETEST_TRAIN.
The reference to the library e.g. USE STD_1149_6_2003.all is missing;
the BSCAN cells of type AC_7 are mentioned, here only BC_7?
No AIO attributes have been defined either.
e.g. -- Advanced I/O Description
attribute AIO_COMPONENT_CONFORMANCE of EP4CGX22CF19 :
entity is "STD_1149_6_2003";
attribute AIO_EXTEST_PULSE_EXECUTION of EP4CGX22CF19 : entity is
"Wait_Duration 10.0e-6";
attribute AIO_Pin_Behavior of EP4CGX22CF19 : entity is
"GXB_RX0p [474] : LP_time=125.0e-9 HP_time=20.0e-6;"&
"GXB_RX1p [479] : LP_time=125.0e-9 HP_time=20.0e-6;"&
"GXB_RX2p [484] : LP_time=125.0e-9 HP_time=20.0e-6;"&
"GXB_RX3p [489] : LP_time=125.0e-9 HP_time=20.0e-6;"&
Is there a newer BSDL file or documentation that allows to make these settings yourself?
Thank you for your efforts!
Best regards
Kathrin Hammerschmidt
