Other Parts Discussed in Thread: DRA821
On our custom board using the DRA821, we are looking to enable some of the BIST tests that are available at power-up. There are some application circuits that we do not have available on our board (PCIE, CAN, etc.). I wanted to ask TI what the expected behavior should be if application-based BIST works without the application circuit being tested, and how much testing was done on BIST for the DRA821 on TI side?
