Hello everyone, when I press the "debug" button, I experience a freeze, followed by error -2172 as mentioned in the title.
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I am using a custom DSP board equipped with a C5502.
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I am using an XDS200 debug probe.
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I have tried CCS from V9 to V12, and the same issue persists.
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During debugging, I am running the Hello World program from the Basic sample.
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When I perform the Test connection, it seems to have no issues, with the following result:
[Start: Texas Instruments XDS2xx USB Debug Probe]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity
[Result]
-----[Print the board config pathname(s)]------------------------------------C:\Users\user\AppData\Local\TEXASI~1\CCS\
ccs930\0\0\BrdDat\testBoard.dat-----[Print the reset-command software log-file]-----------------------------
This utility has selected a 560/2xx-class product.
This utility will load the program 'xds2xxu.out'.
The library build date was 'Nov 25 2019'.
The library build time was '14:43:38'.
The library package version is '8.4.0.00006'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '13' (0x0000000d).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.-----[Print the reset-command hardware log-file]-----------------------------
This emulator does not create a reset log-file.
-----[Perform the Integrity scan-test on the JTAG IR]------------------------
This test will use blocks of 64 32-bit words.
This test will be applied just once.Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.The JTAG IR Integrity scan-test has succeeded.
-----[Perform the Integrity scan-test on the JTAG DR]------------------------
This test will use blocks of 64 32-bit words.
This test will be applied just once.Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.The JTAG DR Integrity scan-test has succeeded.
[End: Texas Instruments XDS2xx USB Debug Probe]
I have shared all the information I can provide. I would like to ask if any of you have encountered similar issues during development?

