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PROCESSOR-SDK-AM62X: Can the AM62X stress test tool support frequency sweep testing?

Chunyen Wang
Prodigy 70 points

Part Number: PROCESSOR-SDK-AM62X

Tool/software:

Based on my experience using the NXP stress test tool, the following is true.

When the CPU powers on, the ROM Code can choose to load a DDR script file via USB Boot. Based on the calibration settings in the DDR script,

the DDR isinitialized.

This tool allows you to fine-tune the DDR clock frequency based on these calibration values for testing. As shown in the image.

you can set the Start Frequency and End Frequency to select the range where the DDR clock frequency will dynamically change.

By clicking the Stress Test Button, the tool performs a frequency sweep test on the DDR within this range by incrementally changing

the frequency.

For example, if the DDR's base frequency is set to 1600MHz, you can set the Start Frequency to 1550MHz and the End Frequency to 1650MHz for testing.

You want to know if TI currently has a similar testing tool that allows for dynamic fine-tuning of the DDR clock frequency for testing?

  • 0
    TI__Guru* 96061 points

    Hi Chunyen, we do not have a similar tool at this time.  Alternatively, you can generate different frequency configurations using the DDR register configuration tool https://dev.ti.com/sysconfig/?product=Processor_DDR_Config&device=AM62x (the tool will allow you to choose a DDR clock frequency that is slightly higher than the supported max frequency), and run memory stress test on each configuration and/or run the margin tool https://www.ti.com/tool/download/DDR-MARGIN-FW on each configuration to compare marginality for each.

    Regards,

    James

  • 0 in reply to JJD
    Prodigy 70 points

    Hi JJD

    could you please explain in detail what tests the DDR-MARGIN-FW tool performs?

  • 0 in reply to Chunyen Wang
    TI__Expert 7525 points

    Greetings Chunyen,

    The firmware sweeps VREF and delay settings to estimate the amount of read margin for the system. First the tool writes a known pattern and then at each combination of VREF and delay it tests the validity of the memory by reading back the pattern. If the pattern reads back successfully then that combination is passing, if it does not then that point is a fail. The tool has the granularity to analyze the amount of margin for each bit in the system by examining failures on the bit level, then the script supplied can visualized each bit's margin.

    What James referred to is that you generate different frequency configurations for your target goals and then you can test each of them individually using the margin firmware or a memory stress test (either in Linux or an open source memtester: https://pyropus.ca./software/memtester/ ). Memtester is a more comprehensive stress test with multiple patterns available and can be run overnight, while the margin firmware has the unique ability to estimate margin by sweeping VREF and delay.

    Sincerely,

    Lucas