Tool/software:
Hello, Dear Expert
Because we suffer from thermal issues with LPDDR4 with customized board, so we consider to use "DDR margin firmware" to compare EYE diagram (T EYE) between high temperature and low temperature.
Here are some question
(1) Do we need to rebuild test app (AM62X_TEye_A53_write/read.out) when we change LPDDR4 size.
(2) This is a double check, if we use uart boot mode and run TEye test program, it does not need to flash this test app into any storage(ex:OSPI), isn't?
this uart boot test mode show an use case that download application to LPDDR, and run it directly, isn't?

Thank You Very Much
Gibbs