Part Number: DRA821U
Other Parts Discussed in Thread: DRA821
Hi team,
Customer are finding issues during HALT rapid temp cycle testing (between -60C to 90C) of their board using DRA821U. We need your support to figure out the cause of such failures.
I don’t think this is a design defect as in the normal operating conditions the board does not trip, but they need to understand and evaluate the design weaknesses for improvement opportunities.
We have gotten them setup with the XDS560v2 connected through JTAG to their board but would like some guidance on how to test. One caveat is that they'd like to eliminate DDR/u-boot from their current setup to limit testing to the DRA821 itself (and not the LPDDR4). Is there any setup that we can reference for DRA821 BIST monitoring test? (maybe using the SRAM/TCM)
Any other advice/recommendations would be greatly appreciated.
Best,
Luke





