Hi,
I just upgraded to EZSDK 5.04 and discovered it impose a new ECC scheme to nand flash. At first glance, nothing to worry, just reflash everything and it works fine. After a while though, I observed data corruption on the flash. The more I tested, the more problems I found. The program "nandtest" often spits "ECC corrected at" messages when I test the device.
When I try the same tests on the same hardware with EZSDK 5.03 and Hamming codes, everything works fine. No more data corruption. At this time, I modified both my u-boot and kernel to use hamming code instead of BCH8 because it is causing too much trouble.
Even when I test EZSDK 5.04 on EVM, nandtest report ECC correction for every tested block. Is there any know issue about the BCH8 implementation in the kernel?
The setup I used is DM8168 on custom hardware, with a 2Gbit nand flash, 8 bit bus witdh and UBIFS. I get similar issue on stock EVM hardware.
Any clue on what is happening is welcome.
Thanks
