Dear TI experts,
We've used C6748 to develop our biometric device based on SYS/BIOS. Now we are at testing stage. One of our mandatory test is memory leak and fragmentation.
Could you give us some hint on how to check memory leak and fragmentation with and without SYS/BIOS? Is there any function like GlobalMemoryStatus in WinCE to check for the momentary memory usage?
Thank you very much,
Best regards,
Tuyen Nguyen