Hi!
My question is about using values, provided by DM365 EMIF in ECC error address registers.
In all this discussion, the number of ECC errors per 512 block, occured while interfacing to NAND flash, is less then 4, i.e. errors are "correctable". (usually 1 error)
The address values of errors can be up to 519, while amount of data we are processing is 512.
UBL program in case when error address is above 512 declares failure. (device_nand.c)
My small experience with getting errors with addresses above 512 shows, that in this case error bits are located in "syndrom" written to OOB.
Is that always so?, and
Is that really sign of failure for Reed-solomon code, as UBL says, or we can just use data and keep in mind that OOB contains flipped bit?
Regards,
German Baranov