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internal RAM testing (DFT)



Hi,

The internal RAM testing has to been done at startup.

Although I did not find any informtion in the docs.

The AM335x technical reference manual mentions :

"DFT

Integrated PBIST controller to test L2 tag and data ram, L1I and L1D data ram and OCM RAM."

It mentions several times to refer to the DFT specs which I did not succeed to find. DFT seems to be only related to USB part.

* How to do this test ? Can we use DFT/PBIST controller for this ?

* Where can I find more information on it ?

Thanks and Regards,

  • Hi,

    Where do you intend to load the program to do this? The ROM code uses internal RAM to load the first-stage bootloader and run it from there.

  • Hi,

    Regarding :

    "• DFT
    – Integrated PBIST controller to test L2 tag and data ram, L1I and L1D data ram and OCM RAM. "

    As it's stated in the SPRUH73j, there is a integrated PBIST on the OCM RAM. In my project , I need to test the internal RAM of 64K (OCM RAM) for medical certification.  

    But there is no information in the datasheet concerning the PBIST on the OCM RAM.

    I just need some information, to know how work this PBIST, how could I use it to fulfill my test functionality, if it's possible to use it.
    I understand that the first stage of the bootloader is done in this memory.

    Thanks,

  • I suggest you contact your nearest TI representative about this use case.

  • Hi Zanzibar

    This is a documentation escape. PBIST and DFT features are for TI internal testing only. There is no plan to enable use of these feature for customers. 
    I will submit a documentation bug to have these features removed from the documentation to avoid confusion. 

    Regards

    Mukul