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AM3352 USB 2.0 compliance test: test pattern generation

Hi All,

I am currently working on Beagle Bone Black prototyped custom board which runs on TI SDK 8.0.

For this board, we need to perform USB2.0 Compliance test. As per the information from TI (link below), we are trying to generate the USB test pattern on board and analyze them using CATC USB analyzer.

processors.wiki.ti.com/.../UsbgeneralpageLinuxCore

Following are the steps:

1. Enabled the kernel debugfs option through menuconfig
2. Mounted the debug file system
3. Force musb to host mode
4. Tested different test patterns
    A) Test packet
    B) Test J pattern
    C) Test K pattern
Note: In between switching the test patterns, the board was reset to reset USB.

In the data captured by the CATC USB analyzer, we are observing packets being received, but could not determine if these are the required test packets.

Is there any way we can confirm that proper USB test data is being generated by the test pattern?

Thanks,
Sridhar CR

  • Hi,

    You are using the correct procedure. The test modes are described in section 7.1.20 of the USB specification Rev. 2.0. The AM335X USB peripheral supports the required test modes in hardware (see section 16.3.10 of the AM335X TRM Rev. L).

  • The test packet is not a real USB packet that the CATC analyzer will recognize. It would have been better to have called the test packet a test pattern because it is a special sequence of data patterns that represents worst case data sequences when generating a data sequence for capturing the eye diagram.

    Regards,
    Paul