Hi experts,
I'm trying to do snow 3G F8 test on K2L EVM board. After installed the latest K2L processor SDK and generated SA examples, I can run SA_BasicExample_w3gpp_K2LC66BiosExampleProject successfully.
Now i met some questions on parameters for snow 3G F8 verification.
According to 3GPP snow3G test data in the last graph. I'm trying to modify saLTETest function parameters in test6.c to do the verification as below. But i can't get correct result. So please help on the following questions. All tests is little-endian mode.
1. Could you please help to let me know if any parameter i missed?
2. I didn't see the program initialized IV, is this not necessary in LTE test?
3. From source code ivLow26 is lower 26 bits of IV, when we need to set up this parameter?
static Sa_AcConfigParams_t salld_gencfg_3gpp_ac[2] = {
{
0xFA556B26,//0x2000, /* Count C */
0x87654321, /* Fresh */
0x1345600,//0x1345600, /* ivLow26 */
sa_AcPduType_LTE,
0x1A, /* ctrlBitMap */
16, /* sessionEncKeySize */
16, /* sessionMacKeySize */
16, /* ivSize */
0 /* macSize */
},
{
0xFA556B26,//0x2000, /* Count C */
0x87654321, /* Fresh */
0x1345600, /* ivLow26 */
sa_AcPduType_LTE,
0x1A, /* ctrlBitMap */
16, /* sessionEncKeySize */
16, /* sessionMacKeySize */
16, /* ivSize */
0 /* macSize */
}
};
static uint8_t salldsim_key1[32] =
{0x10, 0x10, 0xD8,0x52,0x4E, 0xA5, 0xF1, 0x45, 0x4C, 0x0D, 0x51, 0x20, 0x5A,0xCB ,0x1D, 0x64,
0x10, 0x10, 0xD8,0x52,0x4E, 0xA5, 0xF1, 0x45, 0x4C, 0x0D, 0x51, 0x20, 0x5A,0xCB ,0x1D, 0x64};
static uint8_t salldsim_key2[32] =
{0x10, 0x10, 0xD8,0x52,0x4E, 0xA5, 0xF1, 0x45, 0x4C, 0x0D, 0x51, 0x20, 0x5A,0xCB ,0x1D, 0x64,
0x10, 0x10, 0xD8,0x52,0x4E, 0xA5, 0xF1, 0x45, 0x4C, 0x0D, 0x51, 0x20, 0x5A,0xCB ,0x1D, 0x64};
const unsigned char ACPacketLTEToAir[] = {
0xAD,0x9C,0x44,0x1F,0x89,0x0B,0x38,0xC4,
0x57,0xA4,0x9D,0x42,0x14,0x07,0xE8};
Regards,
Allen
