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C6678 DDR3 ECC Memory Test Issue

Hi Sir

we used memory_test project in K1_STK_v1.1 package to do memory test on our customized Board. And the test result is passed.

And we modify the definition as below

#define DDR_ECC_ENABLE 0 -> 1

there was one compiler issue happened and we tracked the code as below 

      DDR_quick_test()  -> Memory_Fill_Test() ->  WritebackInvalidCache() -> CACHE_wbInvL2() -> Exception

Log message is listed as below 

[C66xx_0] JTAG ID= 0x1009e02f. This is C6678/TCI6608 device, version variant = 1.

DEVSTAT= 0x00015801. little endian, No boot or EMIF16(NOR FLASH) or UART boot, PLL configuration implies the input clock for core is 100MHz.

SmartReflex VID= 63, required core voltage= 1.104V.

Die ID= 0x1600500c, 0x0403e918, 0x00000000, 0x5bc60001

Device speed grade = 1000MHz.

Enable Exception handling...

Initialize DSP main clock = 100.00MHz/1x10 = 1000MHz

DDR ECC is enabled.

Initialize DDR speed = 200.00MHzx/3x20 = 1333.333MTS

External exception happened. MEXPFLAG[3]=0x4000.

  Event 110: MDMAERREVT XMC VBUSM error event

  MDMA write status error detected

  XID (Transaction ID)= 5

  Data error

NRP=0x808580, NTSR=0x1000e, IRP=0x20b01120, ITSR=0x1, TSCH= 0x0, TSCL= 0x2730bfe

B3=0x8085c6, A4=0x80000000, B4= 0x1, B14= 0x8237d8, B15= 0x817cd0

Exception happened at a place can not safely return!

please advise and thanks for your help.

BR

Yimin