Part Number: AM3352
Hello!
Could anybody explain me, why at the different sources I found the differnt MTBF for the AM3352?
At the "sprabv9a" I read "The Texas Instruments AM335x products are designed to support an intrinsic reliability goal or wear-out rate of 50 FIT (MTBF = 2 e7 hours) for 100,000 power-on hours (POH), when used at a junction temperature of 105°C and nominal core voltage as defined by the device-specific data sheet. "
But at the 
| Early life failure rate | MTBF / FIT | Early life failure rate supporting data | MTBF / FIT supporting data | |||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Part number | ELFR-DPPM | MTBF | FIT | Conf level (%) | Test temp (�C) | Sample size | Fails | Usage temp (�C) | Conf level (%) | Activation energy (eV) | Test temp (�C) | Test duration (hours) | Sample size | Fails |
| AM3352BZCZD80 | - | 3.621x 10 8 | 2.76 | - | - | - | - | 55 | 60.0 | 0.5 | 130 | 1000 | 1790 |
3 |
So, At the second source the temperature is higher and the MTBF is higher? Why?
