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DRA746: Boundary Scan test

Pricilla Tao
Prodigy 20 points

Part Number: DRA746
Other Parts Discussed in Thread: TDA2

Dear Sir,

We're trying to run the boundary scan test on the board that is using DRA746 and DDR3 (MT41K256M16). We're using the bsdl file "vayu.23x23.bsdl".

The ID of the DRA746 can be recognized properly but when testing the interconnect test and the memory test by IEEE1149.1. All the nets of the DDR3 interface has been sensed as "0". 

Are there any setting that will impact this? Please help to reply.

Thanks,

Pricilla

  • 0
    TI__Genius 10180 points

    Pricilla,

    I am not aware of existing occurrences of DDR1 nets resting at 0 during bscan testing.  Are DDR1 nets the only ones whose values were not sensed correctly?  Can you help provide a sequence of how your tests were executed, including all the test instructions used? 

    Moreover, please double check in the BSDL file header that the chip revision matches the chip you are using.  

    Best Regards,

    Shiou Mei

  • 0 in reply to Shiou Mei Huang
    TI__Mastermind 42515 points
    Hi Pricilla,

    We haven't heard back from you, I'm assuming you were able to resolve your issue.
    If not, just post a reply below (or create a new thread if the thread has locked due to time-out).

    Regards,
    Yordan
  • 0 in reply to Shiou Mei Huang
    Prodigy 20 points
    Dear Shiou Mei,

    The bsdl file that we use is TDA2x_bsdl_23mm.bsdl and the IC part name is TDA2SGBRQABCRQ1 PBGA2.0. Is it the correct one?
    The DDR3 and Nor Flash still can't test properly. We aware that it is mentioned that "Device security features\JTAG® lock" in the TDA2 datasheet, but there is no detailed info. for it. Is it possible that this feature has been enabled? or any suggestions for boundary scan test ?

    Thanks,
    Pricilla

    ----------------------------------------------------------------------
    -- TDA2x Boundary Scan
    ----------------------------------------------------------------------
    -- Supported Devices: TDA2x Revision 1.0 --
    -- Derived from parent device BSDL file --
    -- Does NOT apply to TDA2Ex --
    ----------------------------------------------------------------------
    -- Created by : Texas Instruments Incorporated --
    -- BSDL Revision : 1.1 --
    -- --
    -- BSDL Status : Preliminary --
    -- Package : 23x23 --
    -- Date Created : 03 September 2013 --
    -- --
    ----------------------------------------------------------------------
  • 0 in reply to Pricilla Tao
    TI__Genius 10180 points

    Pricilla,

    I tested BSDL with a TDA2x PG2.0 reference unit on my bench and was not able to reproduce the issue.  Can you help provide more information on your fail mode:

    1. Is result reproducible on multiple units?
    2. What are all the nets with improper values (i.e. address, data, etc)? 
    3. Can you help provide a sequence of how your tests were executed, including all the test instructions used? 

    Thanks & Regards,

    Shiou Mei

    (pending Manoj feedback)

  • 0 in reply to Shiou Mei Huang
    TI__Mastermind 42515 points
    Hi Pricilla,

    We haven't heard back from you, I'm assuming you were able to resolve your issue.
    If not, just post a reply below (or create a new thread if the thread has locked due to time-out).

    Regards,
    Yordan