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66AK2L06: IQNet

Harsha Patil
Prodigy 90 points
Part Number: 66AK2L06

Hello All,

 I am working on IQNet DFE K2L Test Project ,In that interrupts are generated at Slot wise but I want to generate interrupts Symbol wise so what modification I can make in test code? Please Help.

Thanks and Regards,

Harsha Patil

  • 0
    TI__Genius 9065 points

    Harsha,

    IQN generates timing events based on a number of IQ samples passed between IQN and DFE.  There is a master timing reference, and dividers.  In older communication systems there was a direct relationship with IQ rate and symbols.  In OFDM the symbol is spreadout across frequency, based on modulation types and diversity. You could generate a timing interrupt where the first symbol is output after a Downlink Sync or Uplink Sync.

     http://rfmw.em.keysight.com/wireless/helpfiles/89600B/WebHelp/subsystems/lte/content/lte_overview.htm

     

    If you are using an accelerator to generate the OFDM symbols.  The interrupt would need to come from the accelerator.

    The different modulation types in LTE QPSK, QAM, etc would have different numbers of IQ samples and delays.  IQN understands baseband sample timing.

    best regards,

    David Zhou