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TDA4VM: XDS110 port maybe damaged

Neta Sherer
Intellectual 560 points

Part Number: TDA4VM

Hi,

Our native xds110 port of the EVM can not be identified by our PC.

But we have the 'XDS110 debug probe', is it possible to connect that device to the EVM in any certain point as a replacement?

Thx

Neta

  • 0
    TI__Guru** 113810 points

    Hi Neta,

    Yes, it is possible, please refer to this diagram in the User Guide:

    http://software-dl.ti.com/jacinto7/esd/processor-sdk-linux-jacinto7/latest/exports/docs/linux/How_to_Guides/Hardware_Setup_with_CCS/J721E_EVM_Hardware_Setup.html

    Look at the "Beta Board" diagram, you will clearly see the location of the JTAG MIPI on the left hand side. Physically it is located above the microSD card slot.

    Regards

    Karthik

  • 0 in reply to Karthik Ramanan
    Intellectual 560 points

    Hi,

    Thanks for the quick response.
    It claims that if we will connect the XDS probe from the mipi csi, it will automatically will pass to it instead of the USB port.
    Is that correct or that we should configure any switch/Jumper on the board? 

  • 0 in reply to Neta Sherer
    Intellectual 560 points

    Hi,

    After making the connection I got this:

    What's wrong?

    Start: Texas Instruments XDS110 USB Debug Probe_0]

    Execute the command:

    %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity

    [Result]


    -----[Print the board config pathname(s)]------------------------------------

    /home/adasky/.ti/ccs930/0/0/BrdDat/testBoard.dat

    -----[Print the reset-command software log-file]-----------------------------

    This utility has selected a 100- or 510-class product.
    This utility will load the adapter 'libjioxds110.so'.
    The library build date was 'May 7 2020'.
    The library build time was '20:44:54'.
    The library package version is '9.2.0.00002'.
    The library component version is '35.35.0.0'.
    The controller does not use a programmable FPGA.
    The controller has a version number of '5' (0x00000005).
    The controller has an insertion length of '0' (0x00000000).
    This utility will attempt to reset the controller.
    This utility has successfully reset the controller.

    -----[Print the reset-command hardware log-file]-----------------------------

    The scan-path will be reset by toggling the JTAG TRST signal.
    The controller is the XDS110 with USB interface.
    The link from controller to target is direct (without cable).
    The software is configured for XDS110 features.
    The controller cannot monitor the value on the EMU[0] pin.
    The controller cannot monitor the value on the EMU[1] pin.
    The controller cannot control the timing on output pins.
    The controller cannot control the timing on input pins.
    The scan-path link-delay has been set to exactly '0' (0x0000).

    -----[Perform the Integrity scan-test on the JTAG IR]------------------------

    This test will use blocks of 64 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Scan tests: 2, skipped: 0, failed: 0
    Do a test using 0xFE03E0E2.
    Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0.
    Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0.
    Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0.
    Test 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0.
    Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0.
    Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0.
    Test 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0.
    Test 3 Word 7: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 3, skipped: 0, failed: 1
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 2
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 3
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 4
    Some of the values were corrupted - 65.6 percent.

    The JTAG IR Integrity scan-test has failed.

    -----[Perform the Integrity scan-test on the JTAG DR]------------------------

    This test will use blocks of 64 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Scan tests: 2, skipped: 0, failed: 0
    Do a test using 0xFE03E0E2.
    Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0.
    Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0.
    Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0.
    Test 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0.
    Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0.
    Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0.
    Test 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0.
    Test 3 Word 7: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 3, skipped: 0, failed: 1
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 2
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 3
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 4
    Some of the values were corrupted - 65.6 percent.

    The JTAG DR Integrity scan-test has failed.

    [End: Texas Instruments XDS110 USB Debug Probe_0]

  • 0 in reply to Neta Sherer
    Intellectual 560 points

    Hi,

    Configured to a lower TCLK did the job.

    Thanks for the support.

    Neta