Other Parts Discussed in Thread: UNIFLASH, MMWAVEICBOOST,
Hey All:
I'm trying to get code stepping/debugging to work on custom IWR6843 hardware connected to a XDS200. I'm getting error -1170 when I try to run in Debug mode. Here's some background:
- I've imported the "out of box" mmwave demo from the 3.06 SDK into CCS 12 as a test project.
- We DO NOT have an EEPROM populated on our board. Our production IWR firmware is loaded over SPI into RAM on each boot.
- I've fixed the SOP lines to 011 as described in the IWR6843 Bootloader Flow
- Here are the config options I'm using and the error window:
- The connection test passes
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[Start: Texas Instruments XDS2xx USB Debug Probe] Execute the command: %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity [Result] -----[Print the board config pathname(s)]------------------------------------ C:\Users\ERIKBO~1\AppData\Local\TEXASI~1\ CCS\ccs1200\0\0\BrdDat\testBoard.dat -----[Print the reset-command software log-file]----------------------------- This utility has selected a 560/2xx-class product. This utility will load the program 'xds2xxu.out'. The library build date was 'Jun 18 2022'. The library build time was '03:06:08'. The library package version is '9.8.0.00235'. The library component version is '35.35.0.0'. The controller does not use a programmable FPGA. The controller has a version number of '13' (0x0000000d). The controller has an insertion length of '0' (0x00000000). This utility will attempt to reset the controller. This utility has successfully reset the controller. -----[Print the reset-command hardware log-file]----------------------------- This emulator does not create a reset log-file. -----[Perform the Integrity scan-test on the JTAG IR]------------------------ This test will use blocks of 64 32-bit words. This test will be applied just once. Do a test using 0xFFFFFFFF. Scan tests: 1, skipped: 0, failed: 0 Do a test using 0x00000000. Scan tests: 2, skipped: 0, failed: 0 Do a test using 0xFE03E0E2. Scan tests: 3, skipped: 0, failed: 0 Do a test using 0x01FC1F1D. Scan tests: 4, skipped: 0, failed: 0 Do a test using 0x5533CCAA. Scan tests: 5, skipped: 0, failed: 0 Do a test using 0xAACC3355. Scan tests: 6, skipped: 0, failed: 0 All of the values were scanned correctly. The JTAG IR Integrity scan-test has succeeded. -----[Perform the Integrity scan-test on the JTAG DR]------------------------ This test will use blocks of 64 32-bit words. This test will be applied just once. Do a test using 0xFFFFFFFF. Scan tests: 1, skipped: 0, failed: 0 Do a test using 0x00000000. Scan tests: 2, skipped: 0, failed: 0 Do a test using 0xFE03E0E2. Scan tests: 3, skipped: 0, failed: 0 Do a test using 0x01FC1F1D. Scan tests: 4, skipped: 0, failed: 0 Do a test using 0x5533CCAA. Scan tests: 5, skipped: 0, failed: 0 Do a test using 0xAACC3355. Scan tests: 6, skipped: 0, failed: 0 All of the values were scanned correctly. The JTAG DR Integrity scan-test has succeeded. [End: Texas Instruments XDS2xx USB Debug Probe]
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After doing some research on this forum and elsewhere it appears this error comes up often and doesn't point to the root cause at all. Two fixes are often mentioned:
- Set the SOP pins correctly (I think I have).
- Set the image to "development" mode in either CCS or Uniflash.
- We don't use Uniflash because we load the image into RAM over serial.
- I can't find ANY mention of "development mode" in CCS or the utilities that assemble the image (out2rprc and MulticoreImageGen)
- There is no image.syscfg generated when I import the mmwave demo into CCS.
Any help would be much appreciated.
Thanks.
-Erik Bolton