Hi all,
I've been having an issue with the point cloud data that I've obtained when testing with the DLP 4500 EVM. We are using a 5 Mp camera with the projector to capture our data. However when reviewing the captured data we are noticing that the lines seem to be stacking vertically. I've attached some images to clarify but essentially while we are getting good vertical lines that are spaced evenly along the part,(We are only using vertical scans) we are also getting stacking of this line data in the vertical direction (Usually around 6-7 layers deep). This is causing us problems as we are trying to obtain the high data from the pillar but since the surfaces are not on a single plane the measurements are not reliable.
This problem is contestant through every scan we do and with different materials. We have re-calibrated the camera and system many times but to no avail.
Any suggestions would be greatly appreciated.
Best Regards,
John
Top view of part
Side view of part showing vertical stacking of line data. (All surfaces shown here should be flat smooth surfaces)
