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ISO7710-Q1: ISO7710-Q1

Part Number: ISO7710-Q1

Hello, according datasheet the isolation barrier life is up to 40 Years, could you detail me under which condition (junction temperature, isolation voltage ...). Moreover is it possible to get the reliability report ?

Thank you for your help

  • Hi Pascal,

    The isolation barrier lifetime of an isolator is estimated through an industry standard test called Time Dependent Dielectric Breakdown (TDDB). Please see the image below that shows TDDB data for ISO7710-Q1 in WB SOIC-16 (DW) package.

    The above plot shows how much time does the isolation barrier of ISO7710 can withstand a particular stress voltage at 1dppm fail rate. This test is done upto 150C of ambient temperature. The actual lifetime that you see from the plot is a lot more than 40 years but with margins we claim it at >40 years. That I believe answers your question, thanks.

    Regards,

    Koteshwar Rao

  • In reply to Koteshwar Rao:

    Hi Koteshwar,
    Thank you for your feedback, have you a reliability report to communicate ?
    Best Regards

    Pascal
  • In reply to PASCAL GIL:

    Hi Pascal,

    TDDB is primarily the test for device lifetime hence there isn't a report generated by TI based on TDDB. Instead we do have certifications from various standards like VDE, UL, TUV, CSA & CQC. You can find the certifications on ISO7710 product folder on www.ti.com under the tab "Technical Documents" under section "More Literature". I am also copying below the link to ISO7710 Technical Documents folder. Let me know if you have any other questions, thanks.

    www.ti.com/.../technicaldocuments


    Regards,
    Koteshwar Rao
  • In reply to Koteshwar Rao:

    Hi Koteshwar

    That means we have none reliability data to communicate as failure rate (FIT) or MTBF or MTTF ? These standards give us a good confident level but it's important for us to be able to assess the reliability level too.

    Thank you for your support

    Pascal Gil
  • In reply to PASCAL GIL:

    Hi Pascal,

    I'm sorry I misunderstood your question and was relating it to device lifetime. Please find below the reliability data for ISO7710-Q1. Thanks.

    MTBF: 2.02E+09

    FIT: 0.5

    Usage temp : 55C ambient

    Confidence level : 60%

    Regards,

    Koteshwar Rao

  • In reply to Koteshwar Rao:

    Thank you very much for your feedback

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