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DRV8353RH-EVM: Dead time problem

Part Number: DRV8353RH-EVM
Other Parts Discussed in Thread: DRV8353

Hi,

We started evaluation tests with DRV8353RH-EVM evaluation board

According to DRV8353RH data sheet, the Gate drive dead time, tDEAD is 100nS typical

We measured much higher: 264nS and 157nS, see two pictures below:

 

 

Those values will significantly reduced performance of our high-performance motor drivers

How we can get dead time as low as possible (100nS maximum with DRV8353RH)?

Please advice, this is very urgent issue

Best regards,

Zeev Kogan

  • Zeev,

    The reason you are seeing longer dead-time is because the DRV8353 uses VGS monitoring to check the true state of the VGS of each FET to determine if it is truly ON or OFF and inserts extra dead-time on top of the programmed value you mentioned, as needed. Please use a differential probe to check the VGS of the HS and LS FET you are monitoring to check if this is the case. Some IDRIVE adjustment (lower) or snubbing may be required to control the VGS tighter and therefore allow the FETS to switch quicker.

    Regards,

    -Adam