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WEBENCH® Tools/ADS131A04: TINA-TI .TSC file for ADS13104?

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Replies: 3

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Part Number: ADS131A04

Tool/software: WEBENCH® Design Tools

1. In order to design an appropriate ESD/EOS protection circuit for the ADS13104. I need a .TSC file for it. 

2. AND to know what type of built in protection it has on the input.

3. What ADC or ADS that there is a model for which is similar

  • Craig,

    We don't have any behavioral simulation files for the ADS131A04. The closest thing that we have is an IBIS model, which describes the pin inputs with capacitance, resistance, and inductance. This model is used for determining signal integrity. Typically, we don't have input models for the delta-sigma type ADCs.

    The input pins of the device are connected to diodes used for shunting away ESD current. If the input voltages go above the supply or below the ground, then the diode limits the input voltage as it forward biases and directs the current to the supply or ground. 

    Joseph Wu

  • In reply to Joseph Wu:

    Thanks Joseph, How do I get to this ADS131A04 IBIS model and what does it take to read it?

  • In reply to Craig Cooper:

    Craig,


    The IBIS model can be found in the Design & Development tab of the ADS131A04 product folder. You can find a link for models in the link below. There's a zipped file under the Models section. You can download the IBIS model there.

    http://www.ti.com/product/ADS131A04/toolssoftware

    There are a few application notes that describe these models and how they're put together:

    https://www.ti.com/lit/an/szza034/szza034.pdf

    http://www.ti.com/lit/an/slyt390/slyt390.pdf

    http://www.ti.com/lit/an/slyt400/slyt400.pdf

    http://www.ti.com/lit/an/slyt413/slyt413.pdf

    For the models themselves, you can open them with a text reader to see what how they are put together. The first application note describes the structure of the model. For the most part, they work like SPICE models for simulation. I've never needed to simulate them, but have used them for determining parasitic capacitances.


    Joseph Wu

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