We are currently working on several custom boards using CC2640. Some work as expected and others don't. Those that don't get a "SC_ERR_SCAN_POLL_BUSY" error when trying to connect via 2-pin cJTAG (XDS200).
Obviously something wrong with our design, but trying to understand what this error means. Power is present on pins according to ref design.
[Start: Texas Instruments XDS2xx USB Debug Probe_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity
[Result]
-----[Print the board config pathname(s)]------------------------------------
C:\Users\<snip>\AppData\Local\TEXASI~1\
CCS\ti\0\0\BrdDat\testBoard.dat
-----[Print the reset-command software log-file]-----------------------------
This utility has selected a 560/2xx-class product.
This utility will load the program 'xds2xxu.out'.
The library build date was 'Feb 19 2015'.
The library build time was '00:44:06'.
The library package version is '5.1.641.0'.
The library component version is '35.34.40.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '13' (0x0000000d).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
-----[Print the reset-command hardware log-file]-----------------------------
This emulator does not create a reset log-file.
An error occurred while hard opening the controller.
-----[An error has occurred and this utility has aborted]--------------------
This error is generated by TI's USCIF driver or utilities.
The value is '-275' (0xfffffeed).
The title is 'SC_ERR_SCAN_POLL_BUSY'.
The explanation is:
The attempt to poll a target device exceeded its timeout limit.
The utility or debugger has requested that a target device be
repeatedly accessed for a specific data or status value.
This has failed because the built-in limit for the maximum number
of attempts when polling the JTAG scan-path has been exceeded.
[End: Texas Instruments XDS2xx USB Debug Probe_0]
