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LM119QML-SP: Thyristor structure may affect SEE performance

Part Number: LM119QML-SP
Other Parts Discussed in Thread: LM119

Hi team,

In this circuit, are there any thyristor structures in this device? Because my customer concerns that thyristor structures affect Single Event Effect. The reason why he searches is that SEE data that my customer referred to doesn't matche the conditions for actual use.

Also, do we have SEL data for this device?

Best regards,

Shunsuke Yamamoto

  • Hello Shunsuke,

    Not sure if there are purposely built "thyristors" within the device, but there may be similar stacked junctions. I will check with the experts.

  • Hi Shunsuke,

    The LM119 is on a classic junction isolated bipolar process and does not have thyristor or SCR structures found on CMOS products.  Single-Event Latchup would be unexpected.  SEL testing of the LM119 done by NASA can be found by searching on "SINGLE EVENT EFFECT PROTON AND HEAVY ION TEST RESULTS IN SUPPORT OF CANDIDATE NASA PROGRAMS".   Note that other LM119 SEE test data can be found with an internet search or searching IEEE xPLORE.