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LM211-EP: Parameter Differences

Part Number: LM211-EP
Other Parts Discussed in Thread: LM111

Is input offset voltage expected to shift as a device ages during extended storage with conditions within those specified on the datasheet? 

Is output voltage expected to shift as a device ages during extended storage with conditions within those specified on the datasheet?

Which parameters are expected to change the most during extended with storage inside of datasheet specified limits?

Would there be an expected difference between the -EP and the non-EP parts for input offset voltage or output voltage based on the different materials used in construction?

  • Hello Marshall,

    Please see this post:

    https://e2e.ti.com/support/amplifiers-group/amplifiers/f/amplifiers-forum/157178/op-amp-drift-over-time/570347

    Also see this presentation:

    6201.Long-Term Stability.ppt

    Most of your questions are answered in the PPT. Offset voltage could drift up to ±100% over 10 years, and output swing ±10% (see slide 5).

    The LM111/211/311 family is an almost 50 year old design. Since these comparators are not considered "precision" parts, long term offset drift analysis was not done. That is why they have offset adjust pins, so they they can be "zeroed" out in the system if needed.

    I cannot go into details about the differences between the EP and commercial devices. I cannot say they are exactly the same, but they are very, very similar and share a lot of common DNA.. The EP does go through some extra post-manufacturing tests, but I would expect they would age similarly.

    As mentioned in the PPT, heat is the biggest enemy of electronics. The hotter you run it, the more things degrade and the shorter the expected lifecycle. So keep the ambient temperature down, and use as light of a pull-up resistor as possible to lower the output stage dissipation.