Does this part experience any SEFIs that require power cycle or is it just transients? Or has no data been collected on this? Thanks
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Does this part experience any SEFIs that require power cycle or is it just transients? Or has no data been collected on this? Thanks
Hey Lauren,
The testing done on this device was for single event latch-up.
https://www.ti.com/lit/rr/sbok070/sbok070.pdf
I have provided the SEL report above, and the device was shown to be SEL-free up to LETEFF = 43MeV-cm2/mg at 125°C.
Please let me know if you have any further questions, or if this sufficiently answers your question.
Best,
Jerry
Hi Jerry, Thanks. I see that the part is SEL tolerant, but there is no transient or functional interrupt (that may require power cycle if a radiation event occurs), is that correct? Hoping to confirm this.
Hey Lauren,
I don't see specific test documentation for transient or functional interrupts. Could you provide an example of a device that has these tests for reference?
Best,
Jerry
For sure. Page 25 here: https://www.renesas.com/us/en/document/dst/isl71444m-datasheet?r=522426 or page 12 https://www.ti.com/lit/rr/slak024/slak024.pdf?ts=1705015137443
Hello Lauren,
For this device, SEI is not applicable because there is no digital logic or registers that would cause an interrupt. Are you specifically looking for SET testing?
Best,
Jerry
Yes, are there any transients (SET) as well? Thanks for the clarification on the no SEFI/SEIs
Hello Lauren,
For SEP qualification SET was an optional test, and was not performed on the OPA4H199-SEP. SET will be present on QMLP devices. I don't know if I am able to say certainly there are no events that require a power cycle, however, one of the few mechanisms that would require a power cycle for an op amp would be a latch-up event.
Best,
Jerry