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TLV27L2: Input Bias Current between 25 and 33C

Part Number: TLV27L2
Other Parts Discussed in Thread: LMC6042

Hello,

We have been using and buying TLV27L2 for ~10 years.  We would like to know if we can order bin / sorted parts for input bias current?  

Also,  Is input bias current 100% tested at the factory? If not what percentage?

Our use of this part for ~10 years suggest that the input bias current is significantly less than the 1pA the data sheet suggested.   We measure typically 0.5-0.8pA.  

We have consumed approximately 120k parts.  

Thanks,

Keith

  • Hi Keith,

    We have been using and buying TLV27L2 for ~10 years.  We would like to know if we can order bin / sorted parts for input bias current?  

    Is there a reason you are wanting to to bin or sort parts for input bias?

    Also,  Is input bias current 100% tested at the factory? If not what percentage?

    Can you provide more context on why you are wanting to know about the input bias current? 

    We do have a max spec so we have ways of screening out devices that aren't within the max spec. 

    Our use of this part for ~10 years suggest that the input bias current is significantly less than the 1pA the data sheet suggested.   We measure typically 0.5-0.8pA.

    When we start getting into the low pA and fA, I've found that equipment measurement error can start becoming non-negligible at those levels. It's very possible that these differences are measurement error between our different test equipment. 

    Best Regards,

    Robert Clifton 

  • Hi Robert,

    We actually reject parts > 3pA input bias current @ 33C.  We accurately account for measurement errors for every part.  

    Our application is very sensitive to <1pA bias currents.  We have been happy with this part, but would like to improve final assembly yield.  

    I'd like to understand if manufacturing lot data and distribution data is available for the input bias current for this part?  Depending on the distributions, can bin sorting be provided / ordered?

    Thanks,

    Keith

  • Hi Keith,

    I can't share the manufacturing lot data and distribution data. I understand the desire to increase the final assembly yield. Perhaps an alternative device would help with that? 

    We do have devices like the LMC6042 that have much lower bias current specs that might be better. We might have other alternative parts depending on if you also need to have very low quiescent current, and if you are operating in the 16V range. 

    Best Regards,

    Robert Clifton 

  • Hi Robert, 

    An alternate device is not available as a solution due to the verification and validation overhead to do so.  

    Can the data requested be gathered, so we can analyze it and make an informed decision?

    Thanks,

    Keith

  • Hi Keith,

    I'm sorry, but we can't share data distribution as it's sensitive information. 

    The datasheet provides typical and max values. While typical values can vary slightly from lot to lot, we do guarantee that no device goes beyond our max spec. 

    Best Regards,

    Robert Clifton  

  • Hi Robert,

    Honestly, I think this answer is an answer that avoids the request.  Nearly every other semiconductor company either publishes distribution data in data sheets, or will collect it as a special request, or in rare cases will offer to collect it for a fee, and in even more rare cases request to sign an NDA to share such information.  

    Also, no response on capability or cost to bin parts. 

    Also,  no response on if it is a guaranteed by design or 100% test parameter.

  • Hello Robert M.,

    My name is Pete Semig...I'm the applications manager for these devices.

    Our group neither bins nor sorts devices based on any parameter. We do not do this for a 'fee' either.

    Every device (100%) will meet the data sheet recommended min/max values per the data sheet specifications under the data sheet recommended operating conditions listed in and at the top of the table. This is regardless of whether assured by design, test, or characterization. I do want to note that for all parts whose min/max values are tested at final test, we test every single part before it ships (100% coverage). We do not perform any sort of spot-testing, if you will. If you have a device that is not meeting the max specification, please refer to our customer returns page below. It is important to note that the specifications given in the data sheet are good only under the conditions listed in and above the table.

    https://www.ti.com/support-quality/additional-information/customer-returns.html

    Without a MIC NDA (manufacturing information content NDA) we cannot share the rest of the information you're requesting. So, the first step to answer the remainder of your questions is to check for a MIC NDA...if it does not exist then our legal teams must execute one before we can proceed to the next steps. That is the process...and likely very similar to the process of other semiconductor companies. This process, its ownership and its execution are not under my purview.

    Concerning distribution data, please understand that this device is ~23 years old. The data sheet requirements at TI, other semiconductor companies, and for customers at that time did not necessarily require as much information as they do today. That is why you'll see 'missing' information in old data sheets. Even in modern data sheets the information is sometimes tailored to the intended use of the device. For example, a device designed for high-speed applications may have more ac plots in the data sheet and less detailed Iq information. Vice versa for a low-power device. So, there are many factors surrounding the decision of what information to put in a data sheet and in what form, including distribution data and min/max methodology.

    Per Robert C's suggestion, moving to a newer device that does give you the information in the data sheet that is needed to improve yield may be an option that avoids a MIC NDA. However, it appears as though that's not an option due to the required verification and validation of the end application.

    I'm sorry we can't answer more of your questions at this time.

  • Hi Pete,

    Thank you for providing a well thought out response instead of the we can't do that type answer.  

    You are correct, moving to a new device is very cost intensive for us.  Can you provide the contact to start an MIC NDA if we choose to go down that route?  I originally misquoted our consumption of the part.  We have consumed ~210k of these parts.  

    In the meantime, I'll search for a third party who might be able to pre-test the devices we order.  Are you aware of any such third party?

    Since this device is so old, is there any forecast to discontinue this device?  We plan to have our product in production for another 10 years.  

    Thanks,

    Keith

  • Hello Keith,

    This is going to be underwhelming, but my understanding is that your local TI representative usually handles NDAs. Alternately you could contact our customer support center and hopefully they can provide more information:

    Customer support center – Homepage - Customer Support (ti.com)

    While I do not know of any companies that screen devices, I have heard of their existence. As you're acutely aware, measuring such low-level currents with accuracy is not an easy thing to do, much less at 33C. Such a screen will likely be costly. Hopefully the power of the forums come into play here and a community member can point you in the right direction.

    While I cannot predict the availability of the device, TI does have policies for both product life cycle and for when we change/update a product (product change notification, or PCN). Hopefully nothing changes for the next 10 years, but if it does the E2E forums will be here to help.