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We encountered a high fallout in production due to this component. The power register consistently shows a zero reading, with an observed occurrence of 28% across 100 tests. Notably, these failures are not consecutive. The oscilloscope is configured to trigger on I2C bus activities, and the power monitor test is manually initiated. The test is halted upon detecting the failure waveform.
Need your help to check whether there are any issues reported for Texas Instruments MPN# INA219AIDCN worldwide. Are there any datasheets changes or PCN about the changes for this INA219AIDCN?
The date code impacted components are D2312, D2343, D2344, D2348.
Hi,
The last time the INA219 datasheet was updated was December 2015. I have one other customer here asking about the same type of issue, but I believe this would be a system-level issue: https://e2e.ti.com/support/amplifiers-group/amplifiers/f/amplifiers-forum/1358647/ina219-the-ina219-power-registers-reads-zero-at-50-rate-while-looping-on-monitor-the-bus-voltage-the-current-and-the-power-measurement. This customer reported that if they add a delay, then the power register reads non-zero.
Best,
Mohamed
Hi Mohamed, thanks for your reply. Why the power register reads non-zero when some delay is added? Any reason for this with explanation? Will this due to the timing problem? I have this question because the datasheet has been revised from simulation to characterized data on revision G. I have the comparison between revision G (latest) and F (previous) below for your review.
Hi,
Why the power register reads non-zero when some delay is added? Any reason for this with explanation? Will this due to the timing problem?
We are still troubleshooting this issue with the other customer, however I have attempted to recreate the issue with an EVM and was unable to recreate the issue. Therefore we believe it is a system level issue on their end. How old is the datasheet you have? We haven't pushed an update to the INA219 datasheet since 2015.
Best,
Mohamed
Hi Mohamed, in what circumstances that the failure can be narrowed down to system level issue instead of component level issue? Back to the question why the timing value was changed from simulation to physical characterization? Would it due to the timing incorrectness issue in physical component has caused this changes?
Hi,
in what circumstances that the failure can be narrowed down to system level issue instead of component level issue?
I attempted to replicate the issue on a different system, and we could not replicate it. This is what makes me believe it would be a system level issue. The datasheet switched from simulation data to a physical characteristic. Other than that, I'm not sure what difference it made but we haven't had this issue come up before.
Best,
Mohamed