Other Parts Discussed in Thread: , OPA2991, TLV9352, TLV9362
Tool/software:
Product: Servo driver motherboard, UVW three-phase current sampling and processing circuit,
Fault: Generating noise,
Model: TL082IDR,
Description: The product experienced a noise fault during testing, which was found to be caused by TL082IDR. After replacing this IC, the fault was resolved When measuring the diode characteristic values of the sixth and seventh pins of this IC, it was found that the values before the production date of 24 years were between 0.7-0.9, and there would be no noise faults. The values after the production date of 24 years were OL, and about 20% of them would have noise faults
May I ask if there have been any changes to the internal circuit of this IC before and after the production date of 24 years? If there have been no changes, why are the measured values different? Also, please attach a circuit diagram to see if there is a problem with the circuit design, which can be solved by making changes. Thank you
