OPA2196: OPA2196IDR Reliability test data

Kohei,

• You can use this link to see detail on the device qualification: qualification summary.  I pasted the results below.
• The HTOL test is done at 125C for 1000 hrs.  The criteria for passing this test are described in this video:  Engineer It -- Understanding operational amplifier long term 
• In summary, HTOL looks at shifts over the 1000 hrs.  The 1000 hrs at 125C simulates a 10 year life span at 25C.  The test uses a different criteria for specifications that are zero-centered (e.g. Vos ), as compared to specification centered on an absolute value (e.g. Iq).
  
  • For zero centered limits the distrabution width is allowed to shift by 100% (or double) across the life span.  Thus if the input offset limit is -1mV < Vos < +1mV, than after the life test is can shift to -2mV < Vos < +2mV
  • For values centered on an absolute value the limit can shift by ±20%.  Thus if quiescent current spec is 1mA < Iq < 2mA, than the life test limits will be 0.8 < Iq < 2.4mA.  
  • I suggest watching the video link above for more details on how the HTOL test is run.

I hope this helps.  Best regards, Art