This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

LMH6628QML-SP: Die size, production process and SET pulse time for LMH6628QML-SP

Part Number: LMH6628QML-SP
Other Parts Discussed in Thread: LMH6628, , LMH5401, LMH6654, LMH6702, LMH6639

Tool/software:

Hi TI-Team,

we have a radiation (SET) issue with LMH6628 in an analysis. Therefore, we are searching for a solution. We try to simulate the transient and the effects on the following circuit/parts. We recognized that there were examined other LMH components. Another solution for our analysis could be a compare to other devices with the same technology. Also, it would help to know the SET pulse time (actually we have to use a worst case approach from ECSS-Q-ST-60-15C with pulse time of 15us).

Q1: What is the die size of the LMH6628QML-SP? Can you characterize the ASET cross-section for that device?

Q2: Can you confirm that the LMH6628QML-SP is produced with the VIP-10 process?

Q3: We have SET test data for LMH6639, LMH6654, LMH5401 and LMH6702. Which one is most comparable to the LMH6628 (die size, functionality, production process, etc.)

Q4: The maximum SET pulse time within the SET test data is <10ns. Could it be assumed that the SET pulse time for the LMH6628 is similiar?

Test data is available here:

https://radhome.gsfc.nasa.gov/radhome/papers/L061806_LMH6702.pdf

https://www.semanticscholar.org/paper/Analog-Transients-in-the-National-VIP-10-and-VIP-50-Savage-Seiler/161d6f537224220d3613fe0f4cda636d90ea514e

https://www.ti.com/lit/rr/sboa266b/sboa266b.pdf?ts=1742554555906&ref_url=https%253A%252F%252Fwww.ecosia.org%252F

Best regards, Alessandro

  • Hello Alessandro,

      I apologize for the delay. I will be able to get to these questions by today.

    Thank you,

    Sima

  • Hello Sima,

    I would still appreciate your answer.

    Thanks, Best regards, Alessandro

  • Hello Alessandro,

    Q1: What is the die size of the LMH6628QML-SP? Can you characterize the ASET cross-section for that device?

    Die Size: 44.40 mils X 62.40 mils. For second part of question, what is ASET cross-section?

    Q2: Can you confirm that the LMH6628QML-SP is produced with the VIP-10 process?

            Yes this is correct. 

    Q3: We have SET test data for LMH6639, LMH6654, LMH5401 and LMH6702. Which one is most comparable to the LMH6628 (die size, functionality, production process, etc.)

            Process is the key to radiation effects. Any device in the same process would be the most comparable. LMH6639 and LMH6702 would be the most comparable. 

    Q4: The maximum SET pulse time within the SET test data is <10ns. Could it be assumed that the SET pulse time for the LMH6628 is similar?

             Unfortunately, we are unsure of what was the SET pulse time when LMH6628 was characterized. At the time of release, SEL and TID were required, and I am unsure if SET was conducted. Our new and future devices now requiring all reports to be included: SEL, SET, and TID. 

    Thank you,
    Sima  

  • Hello Sima,

    thank you very much for your reply.

    The ASET (analog Single Event Transient) cross-section ist the section which is vulnerable for SET. This is often characterized in radiation test data.

    I'm fine with your answer and this will help me within our project.

    Best regards, Alessandro