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AMC3311-Q1: Inquiry Regarding HIGH SIDE Failure

heeyul choi
Prodigy 60 points
Part Number: AMC3311-Q1


Tool/software:

Condition

Input voltage: 0 ~ 1000VDC

OPAMP input voltage: 0 ~ 2V

Q1. Does a fail-mode voltage output occur when components such as the high-side LDO, DC/DC, or analog input are damaged?

Q2. If the isolation op amp is damaged due to overcurrent at the HIGH SIDE input (IN → HGND), is isolation performance maintained?

Q3. What are the conditions that trigger fail-mode output? (Are there any conditions other than those specified below?)
       The datasheet specifies two conditions for fail-safe output:
          1) No data received by the low-side due to high-side power loss
          2) High-side DC/DC or LDO output voltage drops below undervoltage thresholds

  • 0
    TI__Expert 6610 points

    Hi Heeyul,

    heeyul choi said:
    Q1. Does a fail-mode voltage output occur when components such as the high-side LDO, DC/DC, or analog input are damaged?
    heeyul choi said:
    Q3. What are the conditions that trigger fail-mode output? (Are there any conditions other than those specified below?)
           The datasheet specifies two conditions for fail-safe output:
              1) No data received by the low-side due to high-side power loss
              2) High-side DC/DC or LDO output voltage drops below undervoltage thresholds

    The fail-safe output will show up if high-side is not properly powered (This could be from damage to the high-side components and die) or if there is no data received on the low-side (This could be from the high side not being powered properly, or from any damage to the die causing data not to be transmitted)

    heeyul choi said:
    Q2. If the isolation op amp is damaged due to overcurrent at the HIGH SIDE input (IN → HGND), is isolation performance maintained?

    Please take a look at the following: https://www.ti.com/lit/wp/slyy081b/slyy081b.pdf?ts=1723222033806

    Thanks

  • 0 in reply to Saleh Ahmad
    Prodigy 60 points

    1. In the document(slyy081b), it says that when fail mode 2 occurs, basic insulation is maintained.
    If this is applied to the AMC3311-Q1, does it mean that even after fail mode 2 occurs, the insulation performance described in section 6.6 of the datasheet is still satisfied?

    2. However, the datasheet states that if the limit values are exceeded, the insulation performance may be compromised.
    Isn't that contradictory?

  • 0 in reply to heeyul choi
    TI__Expert 6610 points

    Hi Heeyul,

    heeyul choi said:
    In the document(slyy081b), it says that when fail mode 2 occurs, basic insulation is maintained.
    If this is applied to the AMC3311-Q1, does it mean that even after fail mode 2 occurs, the insulation performance described in section 6.6 of the datasheet is still satisfied

    The device is a dual capacitor based isolator with a reinforced isolation rating.  If a stress event occurs and damages the high side die and capacitor, the isolation performance degrades from reinforced to basic.

    heeyul choi said:
    However, the datasheet states that if the limit values are exceeded, the insulation performance may be compromised.
    Isn't that contradictory?

    The insulation performance can degrade (reinforced to basic) if enough damage occurs.

    Thanks.