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LM193: Query regarding PCN: 20251003000.1

vamsi krishna2
Prodigy 40 points

Part Number: LM193

Dear Team TI,

We have received PCN:  20251003000.1.pdf  and while reviewing, we have a query regarding the qualification details mentioned in the PCN form.

The PCN lists qualification for the following parts:

DS90LV019TMX (SOIC-14)

LM6172IM/NOPB (SOIC-8)

UCC21330BQDRQ1 (SOIC-16)

Our affected parts are LM193DR and LM193DRG4 (SOIC-8). As per JEDEC guidelines, can we assume that TI has performed qualification for each package using 3 lots and 231 samples, or is it 1 lot and 77 samples per package?

Please confirm the approach followed for qualification.

Ragards,

Pranita

  • 0
    TI__Guru 68466 points

    Hello Pranita,

    Qualification summaries for all devices are available on the Qual Summary page:

    Qualification summary

    The LM193DR was three lots of 77 units for HTOL.

  • 0 in reply to Paul Grohe
    Prodigy 40 points

    Hello Paul,

    Thank you for your response. I have one more question for clarification:
    How can we determine whether the qualification summary link you provided is related to the PCN or if it is specific to the individual part?

    Additionally, when I search for a particular part, the report date displayed appears as today’s date rather than the original date when the report was created. Could you please confirm why this happens?

    Regards,

    Pranita




  • 0 in reply to vamsi krishna2
    TI__Guru**** 174356 points

    Pranita,

    Paul will answer next week after Thanksgiving Holiday. 

  • 0 in reply to vamsi krishna2
    TI__Guru 68466 points

    Hello Pranita,

    The PCN  20251003000.1.pdf  you refer to is a SOIC package and assembly site qualification. It contains the qualification data at the time for the package.

    Package qualification is qualified by "QBS" (Qualification By Similarity) - so the package qualification may be a different device - but the same package BOM and process. This is explained tin the text below the tables (pages 5-6).

    The Qualification summary report is generated on-the-fly from the qualification data in our system for that particular device.

    Electrically, each device is tested and the on-line Qualification summary contains the results for each device.

    Whether the tests were performed yesterday or two years ago, it does not change the results. The tests are performed on the latest available silicon and JEDEC/AEC standards at the time of release.