Team-
Fig. 23 of the OPA2376 data sheet indicates that V,os begins to degrade as V,cm -> 0V.
The data sheet spec's V,os for V,cm = Vs/2.
How much degradation of V,os can we expect when V,cm -> 0V?
Thanks, Best, S. Dunbar, AFA Colorado
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Team-
Fig. 23 of the OPA2376 data sheet indicates that V,os begins to degrade as V,cm -> 0V.
The data sheet spec's V,os for V,cm = Vs/2.
How much degradation of V,os can we expect when V,cm -> 0V?
Thanks, Best, S. Dunbar, AFA Colorado
Hi Steve,
The change in offset voltage vs. common-mode is most prevalent in the upper common-mode voltages where the NPN input stage takes over to prevent phase margin and allow for a functional rail-to-rail input stage. The common-mode rejection ratio defines the change in offset voltage vs. common-mode voltage and is valid over the region in question near V-. Therefore the worst-case change in input offset voltage vs. VCM near the V- supply is 76dB or roughly 158uV/V.
Hi Tim,
The input bias current of a typical CMOS op amp is dominated by leakage current through the ESD protection diodes. As a result the input bias current will double every 10C. The typical input bias current is 0.2pA at 25C. Moving from 25C to 75C, the input bias current will double 5 times (75C - 25C) / 10C = 5. Therefore, the input bias current can be estimated to be 0.2 * 2^5 = 6.4pA. Datasheet graphs represent the typical device performance unless otherwise noted and Figure 11 matches well with the calculation.
The input bias current will change minimally over the input common-mode range of the device. Once the input common-mode range is exceeded the input bias current will increase significantly as the protection cells begin to conduct.
Hi Tim,
The calculations for the maximum bias current are correct. Your calculation steps for the offset voltage are correct, but you should use the 1uV/C specification for temperatures under 85C (see spec table below). So the maximum Vos due to temperature at 75C is 25uV + 50C * 1uV/C = 75uV, yielding an absolute worst-case situation of 471uV.
That said, both of these conditions are unlikely to occur in a production system. Devices with a single maximum specification are already on the far edges of the Gaussian distribution, making them rare. A device that would display all of the maximum specifications is nearly statistically impossible. This is because most maximum specifications represent at least a +/-3sigma distribution (99.7%), meaning only 0.3% of the entire population of produced devices have one specification at or above the maximum limit. Devices outside the maximum limit are discarded. Combining even two maximum specifications results in a +/-6 sigma type device or 1 in 500 million units. Combining more maximum specifications results in an even more unlikely device.
So, while your results do predict the absolute worst scenario you could encounter using this device, the chances of you receiving such a device are very small. Often specifications are combined using an RSS (root of the sum of squares) method to produce more probable results.