Part Number: OPA333
Hi,
I'm developing a Band Gap Reference (BGR) circuit around OPA333(Please find the attachment for circuit details). The good news is when the test circuit is subjected to real temperature tests it's having a almost same temperature drift as given by TINA TI simulation. But this is only for steady state. As there are temperature transients (ramps) the BGR output is having large swings before it can stable over the new temperature. Test data is also attached. Currently I'm having the circuit built on a vero board as a prototype(Please find the image of the circuit also)
Anything I can do to get rid of unwanted transient behavior. Any heads up 'd be appreciated
Thanks,
Kavindu