Other Parts Discussed in Thread: TL082, LM50,
Hi,
my customer is using TL082 to sense the output current of their DCDC power supply.
Before the aging test, they will measure the output of TL082 by applying 2.6mV to Isamp, and will get a value like 100mV at pin 1 of TL082 at 25C temperature.
Then they will test the whole equipment in a chamber for 24hour, during which the board temperature(measured by LM50) is up to 100C.
After the aging test, they will measure the output of TL082 with the same input, now they will get a value like 14mV at pin1 at 25C temperature.
So the offset of TL082 changes after the aging test.
My question is:
Why would we get such big error? Is it what should be expected?
100C board temperature should not cause the damage of the device TL082BCDR since the absolutely maximum junction temperature is 150C.
And we are measuring the difference at both 25C temperature.

