Hi,
here is my setup:
* TAS5828 connected to TMS320F28377 over McBSP in I2S-mode (the I2S-signals are ok).
* PBTL, 24V, 8 Ohm load.
* Output signal: sinus, 20V, 333 Hz. Load power: 25W.
Everything works fine, but there is something interesting ...
* Most prototypes do not have a problem, this test with 25W output power is running for an hour correctly.
* I have got two prototypes reporting a clock fault: Register 0x71, bit 2, CLK_FAULT_IR0 Clock fault. Once there is a Clock fault, this bit is set to be 1. Class D output is set to Hi-Z.
* This fault occurs some minutes after starting the test and causes a short high-Z-state. Not good ...
Now I tried to disable the clock detection stuff by setting the CLOCK_DET_CTRL register 0x29=0x7C: ignore all clock detection faults.
And: Everything is running fine. No high-Z. No wrong output sample (persist=infinite on scope).
Is there anything that I should know? Is there anything I did not read in the datasheet?
Best regards,
Edwin