Found the 13.5% (54pcs out of 400pcs)failure rate for this one material due to it failed at Function test with Noise failure , we did swap experiment to verify it still failed, here we will send 3pcs for you for FA,pls comment
We summited CPR221061993,but your side need us reply more question and refer to the E2E firstly
our more information as below:
TI has reviewed this request and determined that the problem description is not clear.
Please update the problem description.
1. Pls. provide IC level failure description. How to confirm noise is caused by IC?
a. Which function cannot meet TI datasheet or which pins have the abnormal behavior
b. Customer testing limits/condition.
c. Customer measured value (failed vs. good), if waveform is appreciated.
----C
Need rule out application factors and point out IC problem,
then submit FA request. Suggest to consult with TI FAE or go to E2E firstly (https://e2e.ti.com/p/addpost).