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LMX2492: LMX2492

Farokh Irom
Prodigy 20 points
Part Number: LMX2492

Tool/software:

I would appreciate it if you send me the heavy ion test report for LMX2492.

One of my projects is interested to use LMX2492 (Automotive version).

I need to provide rate for SEFI, SEU, loss of lock and other single event effects were observed during heavy ion measurements.

  • 0
    TI__Guru** 107870 points

    Hi Farokh,

    LMX2492 is not qualified for radiation harden application, we don't have those testing reports.

  • 0
    TI__Guru** 107870 points

    Hi Farokh,

    LMX2492 is not qualified for radiation harden application, we don't have those testing reports.

  • 0
    Prodigy 20 points

    From Kirby Kruckmeyer paper: TID and SEL Test Results for Texas Instruments’ LMX2492 14 GHz PLL

    "During heavy ion testing, single event functional interrupts (SEFI) and loss of lock events were detected at all linear energy transfers (LET) used. Sometimes, the DUT would recover on its own. In other cases, the DUT would remain inoperable until the registers were rewritten through the SPI. In neither case was recycling the power supplies required to get the part operational. Details on SEFI, SEU, loss of lock and other single event effects are beyond the scope of this paper and will be discussed at a later date. "

  • 0 in reply to Farokh Irom
    TI__Guru** 107870 points

    Hi Farokh,

    I don't aware we have this exercise on this device, however, the true is we did not release this radiation hardened version LMX2492 to the market. I am afraid I cannot share the test reports (if any) to external party.