Tool/software:
Hello,
Looking at LMX2694-SEP Single Event Effects Test Report (Rev. A) , my customer has some questions as follows.
Q1:
According to the SEE Test report, SEU is occurring, but is there anything like a SET occurring? If yes, does TI also have data in the time domain to check if output level fluctuations and output frequency fluctuations occur? They would also like to know the input/output frequency and loop constant setting conditions.
Q2:
Is there a waveform of the output signal when SEU occurs as shown in Figure 4-2? Similarly, dose TI have time domain data for output level fluctuations and output frequency fluctuations?
Q3:
They would like to get data on the frequency of SEU and SET occurrences. Or, they would like to have Weibull data like "let[MeV*cm2/mg] vs. Cross section[cm2]".
Q4:
In the state of "SYSREF disable", self-calibrate does not occur, but this might be only because the spike current is not visible. Is there any possibility that some characteristics or bit settings are abnormal?
Q5:
Is LET measurement was done at only 43 MeV -cm2/mg?
Best regards,
K.Hirano
