Part Number: LMX2594
Other Parts Discussed in Thread: LMX2615-SP, LMX2624-SP, LMX2694-SEP
Dear TI Support,
we are currently assessing the LMX2594RHAT for use in a space application and are performing the related Radiation Hardness Assurance analysis.
Could you please confirm whether Texas Instruments has any radiation test data or internal/external radiation test reports available for the LMX2594, and in particular for the LMX2594RHAT?
We are especially interested in any available characterization concerning Single Event Effects (SEE), including SEL, SEU, SEFI and SET, as well as Total Ionizing Dose (TID) data.
If no public report is available, could you please let us know whether any non-public/internal characterization exists or whether radiation data from another TI device can be considered representative of the same die/process technology?
Thank you in advance for your support.
