I am seeking SEEA (upset rate) information on a discontinued, but-still-widely-used National Semiconductor device, 54ACT3301 - a clock driver.
This best fits into a SPACE-related forum,
Thanks in advance
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I am seeking SEEA (upset rate) information on a discontinued, but-still-widely-used National Semiconductor device, 54ACT3301 - a clock driver.
This best fits into a SPACE-related forum,
Thanks in advance
This device was obsoleted by National Semiconductor and is not supported by TI. However, I did come across this app note that discusses SEU and SEL test results for different test devices fabricated by National using Fairchild's FACT technology. I hope this helps. It appears SiliconSupplies offers a bare die direct (electrical and functional) replacement for this device. Perhaps that could be another resource to find some answers you're seeking?

Regards,
Alan