Running the chip at 6.4GHz, 16 Channels of data over JESD204 is working correctly and subclass 0 is running smoothly to a Xilinx MPSoC. When I run test patterns from the ADC I get bad data on some channels. Always the same bad channels.
Test pattern 4 or ramp i get errors that are code based.
instead of 0xB0 i get 0xAF
0x64 i get 0x7B
0x67 i get 0x78
Across all 16 channels. I have not done an exhaustive search in this mapping.
Test pattern 5 or Short Transport Test Pattern
0x03 => 0x1C
0x05 => 0x1A
0x06 => 0x19
0xFC => 0xE3
0xFA => 0xE5
0xF9 => 0xE6
And in this case it is isolated to 6 of the 16 lanes because of the nature of the test pattern. This test is the same on both A group of 8 and B group of 8.
Am I not configured correctly? I have double checked my polarity.